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Antenna Near-Field Probe Station ScannerA miniaturized antenna system is characterized non-destructively through the use of a scanner that measures its near-field radiated power performance. When taking measurements, the scanner can be moved linearly along the x, y and z axis, as well as rotationally relative to the antenna. The data obtained from the characterization are processed to determine the far-field properties of the system and to optimize the system. Each antenna is excited using a probe station system while a scanning probe scans the space above the antenna to measure the near field signals. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. Along with taking data, this system also allows for extensive graphing and analysis of both the near-field and far-field data. The details of the probe station as well as the procedures for setting up a test, conducting a test, and analyzing the resulting data are also described.
Document ID
20110004229
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Zaman, Afroz J.
Lee, Richard Q.
Darby, William G.
Barr, Philip J.
Lambert, Kevin M
Miranda, Felix A.
Date Acquired
August 25, 2013
Publication Date
January 25, 2011
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
Patent Application Number: US-Patent-Appl-SN-11/499,982
Patent Number: US-Patent-7,876,276
Patent Number: NASA-Case-LEW-17877-1
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-7,876,276|NASA-Case-LEW-17877-1
Patent Application
US-Patent-Appl-SN-11/499,982
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