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Defect Depth Measurement Using White Light InterferometryThe objectives of the White Light Interferometry project are the following: (1) Demonstrate a small hand-held instrument capable of performing inspections of identified defects on Orbiter outer pane window surfaces. (2) Build and field-test a prototype device using miniaturized optical components. (3) Modify the instrument based on field testing and begin the conversion of the unit to become a certified shop-aid.
Document ID
20110008328
Acquisition Source
Kennedy Space Center
Document Type
Other
Authors
Parker, Don
Starr, Stan
Date Acquired
August 25, 2013
Publication Date
January 1, 2009
Subject Category
Astronautics (General)
Report/Patent Number
KSC-2009-293
Report Number: KSC-2009-293
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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