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LC Circuits for Diagnosing Embedded Piezoelectric DevicesA recently invented method of nonintrusively detecting faults in piezoelectric devices involves measurement of the resonance frequencies of inductor capacitor (LC) resonant circuits. The method is intended especially to enable diagnosis of piezoelectric sensors, actuators, and sensor/actuators that are embedded in structures and/or are components of multilayer composite material structures.
Document ID
20110014939
Acquisition Source
Langley Research Center
Document Type
Other - NASA Tech Brief
Authors
Chattin, Richard L.
(NASA Langley Research Center Hampton, VA, United States)
Fox, Robert Lee
(NASA Langley Research Center Hampton, VA, United States)
Moses, Robert W.
(NASA Langley Research Center Hampton, VA, United States)
Shams, Qamar A.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 25, 2013
Publication Date
June 1, 2005
Publication Information
Publication: NASA Tech Briefs, June 2005
Subject Category
Engineering (General)
Report/Patent Number
LAR-16549-1
Report Number: LAR-16549-1
Distribution Limits
Public
Copyright
Public Use Permitted.
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