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Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASAWe present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Document ID
20110015231
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
O'Bryan, Martha V. (MEI Technologies, Inc. Greenbelt, MD, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Pellish, Jonathan A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Lauenstein, Jean-Marie (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Marshall, Cheryl (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ladbury, Ray L. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Carts, Martin A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Sanders, Anthony B. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Xapsos, Michael A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Chen, Dakai (MEI Technologies, Inc. Greenbelt, MD, United States)
Kim, Hak S. (MEI Technologies, Inc. Greenbelt, MD, United States)
Phan, Anthony M. (MEI Technologies, Inc. Greenbelt, MD, United States)
Berg, Melanie (MEI Technologies, Inc. Greenbelt, MD, United States)
Oldham, Timothy R. (Perot Systems Corp. Greenbelt, MD, United States)
Buchner, Stephen P. (Global Defense Technology and Systems, Inc. United States)
Marshall, Paul (Marshall (Paul) Consultant United States)
Irom, Farokh (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Pearce, Larry G. (Intersil Corp. Palm Bay, FL, United States)
Thomson, Eric T. (Intersil Corp. Palm Bay, FL, United States)
Bernard, Theju M. (Intersil Corp. Palm Bay, FL, United States)
Satterfield, Harold W. (Intersil Corp. Palm Bay, FL, United States)
Williams, Alan P. (Intersil Corp. Palm Bay, FL, United States)
vonVonno, Nick W. (Intersil Corp. Palm Bay, FL, United States)
Salzman, James F. (Texas Instruments, Inc. TX, United States)
Burns, Sam (Linear Technology United States)
Date Acquired
August 25, 2013
Publication Date
July 19, 2010
Subject Category
Avionics And Aircraft Instrumentation
Report/Patent Number
GSFC.CP.4804.2011
Report Number: GSFC.CP.4804.2011
Meeting Information
Meeting: Nuclear and Space Radiation Effects Conference (NSREC) Data Workshop
Location: Denver, CO
Country: United States
Start Date: July 19, 2010
End Date: July 23, 2010
Funding Number(s)
CONTRACT_GRANT: IACRO 09-4587I
CONTRACT_GRANT: IACRO 10-4977I
Distribution Limits
Public
Copyright
Public Use Permitted.

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