NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
Statistical Techniques for Analyzing Process or "Similarity" Data in TID Hardness AssuranceWe investigate techniques for estimating the contributions to TID hardness variability for families of linear bipolar technologies, determining how part-to-part and lot-to-lot variability change for different part types in the process.
Document ID
20110015449
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Ladbury, R. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 25, 2013
Publication Date
July 19, 2010
Subject Category
Statistics And Probability
Report/Patent Number
GSFC.JA.4852.2011
Report Number: GSFC.JA.4852.2011
Meeting Information
Meeting: 2010 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2010)
Location: Denver, CO
Country: United States
Start Date: July 19, 2010
End Date: July 23, 2010
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

There are no records associated with this record.
No Preview Available