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Failure Analysis of Nonvolatile Residue (NVR) Analyzer Model SP-1000National Aeronautics and Space Administration (NASA) subcontractor Wiltech contacted the NASA Electrical Lab (NE-L) and requested a failure analysis of a Solvent Purity Meter; model SP-IOOO produced by the VerTis Instrument Company. The meter, used to measure the contaminate in a solvent to determine the relative contamination on spacecraft flight hardware and ground servicing equipment, had been inoperable and in storage for an unknown amount of time. NE-L was asked to troubleshoot the unit and make a determination on what may be required to make the unit operational. Through the use of general troubleshooting processes and the review of a unit in service at the time of analysis, the unit was found to be repairable but would need the replacement of multiple components.
Document ID
20110015854
Acquisition Source
Kennedy Space Center
Document Type
Other
Authors
Potter, Joseph C.
(Michigan Univ. Ann Arbor, MI, United States)
Date Acquired
August 25, 2013
Publication Date
January 1, 2011
Subject Category
Instrumentation And Photography
Report/Patent Number
KSC-2011-207
Report Number: KSC-2011-207
Distribution Limits
Public
Copyright
Public Use Permitted.
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