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Metrology for Project DevelopmentPresentation Topics are: 1. What is metrology 2. Measurement related risks and their consequences
Document ID
20120003448
Acquisition Source
Kennedy Space Center
Document Type
Presentation
Authors
Mimbs, Scott M. (NASA Kennedy Space Center Cocoa Beach, FL, United States)
Date Acquired
August 25, 2013
Publication Date
February 8, 2012
Subject Category
Engineering (General)
Report/Patent Number
KSC-2012-036
Report Number: KSC-2012-036
Meeting Information
Meeting: IBM Rational Systems and Software Engineering Symposium
Location: Huntsville, AL
Country: United States
Start Date: April 5, 2012
Sponsors: IBM Corporation
Distribution Limits
Public
Copyright
Public Use Permitted.

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