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Status on Radiation Qualification Methods for SOC DevicesNo abstract available
Document ID
20120013798
Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
External Source(s)
hdl:2014/42172
Authors
Guertin, Steven M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 26, 2013
Publication Date
June 29, 2011
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Status on Radiation Qualification Methods for SOC Devices
Location: Pasadena, CA
Country: United States
Start Date: June 28, 2011
End Date: June 29, 2011
Distribution Limits
Public
Copyright
Other
Keywords
Radiation Hardening by Design (RHBD)
Test Methods
System-On-Chip (SoC) devices
Electronics and Electrical Engineering (SEE) Test Methods

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