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System to Measure Thermal Conductivity and Seebeck Coefficient for ThermoelectricsThe Seebeck coefficient, when combined with thermal and electrical conductivity, is an essential property measurement for evaluating the potential performance of novel thermoelectric materials. However, there is some question as to which measurement technique(s) provides the most accurate determination of the Seebeck coefficient at elevated temperatures. This has led to the implementation of nonstandardized practices that have further complicated the confirmation of reported high ZT materials. The major objective of the procedure described is for the simultaneous measurement of the Seebeck coefficient and thermal diffusivity within a given temperature range. These thermoelectric measurements must be precise, accurate, and reproducible to ensure meaningful interlaboratory comparison of data. The custom-built thermal characterization system described in this NASA-TM is specifically designed to measure the inplane thermal diffusivity, and the Seebeck coefficient for materials in the ranging from 73 K through 373 K.
Document ID
20130001757
Acquisition Source
Langley Research Center
Document Type
Technical Memorandum (TM)
Authors
Kim, Hyun-Jung
(National Inst. of Aerospace Hampton, VA, United States)
Skuza, Jonathan R.
(National Inst. of Aerospace Hampton, VA, United States)
Park, Yeonjoon
(National Inst. of Aerospace Hampton, VA, United States)
King, Glen C.
(NASA Langley Research Center Hampton, VA, United States)
Choi, Sang H.
(NASA Langley Research Center Hampton, VA, United States)
Nagavalli, Anita
(North Carolina State Univ. Raleigh, NC, United States)
Date Acquired
August 27, 2013
Publication Date
December 1, 2012
Subject Category
Engineering (General)
Report/Patent Number
LF99-15831
L-20213
NASA/TM-2012-217791
Report Number: LF99-15831
Report Number: L-20213
Report Number: NASA/TM-2012-217791
Funding Number(s)
WBS: WBS 392259.02.07.9923.11
CONTRACT_GRANT: IA1-1098
Distribution Limits
Public
Copyright
Public Use Permitted.
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