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DDR2 Device Reliability UpdateNo abstract available
Document ID
20130009337
Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
External Source(s)
hdl:2014/42660
Authors
Guertin, Steven M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 27, 2013
Publication Date
June 11, 2012
Subject Category
Mechanical Engineering
Meeting Information
Meeting: Identifier Data: 3rd NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology Workshop
Location: Greenbelt, MD
Country: United States
Start Date: June 11, 2012
End Date: June 13, 2012
Distribution Limits
Public
Copyright
Other
Keywords
DDR2
temperature acceleration
life testing
voltage acceleration
pattern dependence
device reliabilty
DIMM

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