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Cleaning Study of Genesis Sample 60487The Genesis mission collected solar wind and brought it back to Earth in order to provide precise knowledge of solar isotopic and elemental compositions. The ions in the solar wind were stopped in the collectors at depths on the order of 10 to a few hundred nanometers. This shallow implantation layer is critical for scientific analysis of the composition of the solar wind and must be preserved throughout sample handling, cleaning, processing, distribution, preparation and analysis. Particles of Genesis wafers, brine from the Utah Testing Range and an organic film have deleterious effects on many of the high-resolution instruments that have been developed to analyze the implanted solar wind. We have conducted a correlative microscopic study of the efficacy of cleaning Genesis samples with megasonically activated ultrapure water and UV/ozone cleaning. Sample 60487, the study sample, is a piece of float-zone silicon from the B/C array approximately 4.995mm x 4.145 mm in size
Document ID
20130011126
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
Kuhlman, Kim R.
(Planetary Science Inst. Tucson, AZ, United States)
Rodriquez, M. C.
(NASA Johnson Space Center Houston, TX, United States)
Gonzalez, C. P.
(NASA Johnson Space Center Houston, TX, United States)
Allton, J. H.
(NASA Johnson Space Center Houston, TX, United States)
Burnett, D. S.
(California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 27, 2013
Publication Date
March 18, 2013
Subject Category
Nonmetallic Materials
Report/Patent Number
JSC-CN-28283
Report Number: JSC-CN-28283
Meeting Information
Meeting: Lunar Planetary Science Conference
Location: The Woodlands, TX
Country: United States
Start Date: March 18, 2013
End Date: March 22, 2013
Distribution Limits
Public
Copyright
Public Use Permitted.
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