NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Discovery: Under the Microscope at Kennedy Space CenterThe National Aeronautics & Space Administration (NASA) is known for discovery, exploration, and advancement of knowledge. Since the days of Leeuwenhoek, microscopy has been at the forefront of discovery and knowledge. No truer is that statement than today at Kennedy Space Center (KSC), where microscopy plays a major role in contamination identification and is an integral part of failure analysis. Space exploration involves flight hardware undergoing rigorous "visually clean" inspections at every step of processing. The unknown contaminants that are discovered on these inspections can directly impact the mission by decreasing performance of sensors and scientific detectors on spacecraft and satellites, acting as micrometeorites, damaging critical sealing surfaces, and causing hazards to the crew of manned missions. This talk will discuss how microscopy has played a major role in all aspects of space port operations at KSC. Case studies will highlight years of analysis at the Materials Science Division including facility and payload contamination for the Navigation Signal Timing and Ranging Global Positioning Satellites (NA VST AR GPS) missions, quality control monitoring of monomethyl hydrazine fuel procurement for launch vehicle operations, Shuttle Solids Rocket Booster (SRB) foam processing failure analysis, and Space Shuttle Main Engine Cut-off (ECO) flight sensor anomaly analysis. What I hope to share with my fellow microscopists is some of the excitement of microscopy and how its discoveries has led to hardware processing, that has helped enable the successful launch of vehicles and space flight missions here at Kennedy Space Center.
Document ID
20130011601
Acquisition Source
Kennedy Space Center
Document Type
Conference Paper
Authors
Howard, Philip M.
(NASA Kennedy Space Center Cocoa Beach, FL, United States)
Date Acquired
August 27, 2013
Publication Date
January 1, 2013
Subject Category
Quality Assurance And Reliability
Report/Patent Number
KSC-2013-026
Report Number: KSC-2013-026
Meeting Information
Meeting: Microscopy and Microanalysis 2013
Location: Indianapolis, IN
Country: United States
Start Date: August 3, 2013
End Date: August 8, 2013
Sponsors: Microscopy Society of America
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available