Electrostatic Characterization of Lunar Dust SimulantsLunar dust can jeopardize exploration activities due to its ability to cling to most surfaces. In this paper, we report on our measurements of the electrostatic properties of the lunar soil simulants. Methods have been developed to measure the volume resistivity, dielectric constant, chargeability, and charge decay of lunar soil. While the first two parameters have been measured in the past [Olhoeft 1974], the last two have never been measured directly on the lunar regolith or on any of the Apollo samples. Measurements of the electrical properties of the lunar samples are being performed in an attempt to answer important problems that must be solved for the development of an effective dust mitigation technology, namely, how much charge can accumulate on the dust and how long does the charge remain on surfaces. The measurements will help develop coatings that are compatible with the intrinsic electrostatic properties of the lunar regolith.
Document ID
20130012059
Acquisition Source
Kennedy Space Center
Document Type
Conference Paper
Authors
Calle, C. I. (NASA Kennedy Space Center Cocoa Beach, FL, United States)
Buhler, C. R. (ASRC Aerospace Corp. Cocoa Beach, FL, United States)
Ritz, M. L. (ASRC Aerospace Corp. Cocoa Beach, FL, United States)
Date Acquired
August 27, 2013
Publication Date
February 10, 2008
Subject Category
Lunar And Planetary Science And Exploration
Report/Patent Number
KSC-2008-030Report Number: KSC-2008-030
Meeting Information
Meeting: Space Technology and Applications International Forum