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Physics of Failure Analysis of Xilinx Flip Chip CCGA Packages: Effects of Mission Environments on Properties of LP2 Underfill and ATI Lid Adhesive MaterialsThe Xilinx Virtex 4QV and 5QV (V4 and V5) are next-generation field-programmable gate arrays (FPGAs) for space applications. However, there have been concerns within the space community regarding the non-hermeticity of V4/V5 packages; polymeric materials such as the underfill and lid adhesive will be directly exposed to the space environment. In this study, reliability concerns associated with the non-hermeticity of V4/V5 packages were investigated by studying properties and behavior of the underfill and the lid adhesvie materials used in V4/V5 packages.
Document ID
20140000672
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
Authors
Suh, Jong-ook
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
February 11, 2014
Publication Date
April 1, 2013
Subject Category
Quality Assurance And Reliability
Report/Patent Number
JPL-Publ-13-8
Report Number: JPL-Publ-13-8
Funding Number(s)
WBS: WBS 40.49.02.13
WBS: WBS 724297.40.49.11
CONTRACT_GRANT: NAS7-03001
Distribution Limits
Public
Copyright
Public Use Permitted.
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