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Modeling Contamination Migration on the Chandra X-ray Observatory IIDuring its first 14 years of operation, the cold (about ‐60degC) optical blocking filter of the Advanced CCD Imaging Spectrometer (ACIS), aboard the Chandra X‐ray Observatory, has accumulated a growing layer of molecular contamination that attenuates low‐energy x rays. Over the past few years, the accumulation rate, spatial distribution, and composition may have changed, perhaps partially related to changes in the operating temperature of the ACIS housing. This evolution of the accumulation of the molecular contamination has motivated further analysis of contamination migration on the Chandra X‐ray Observatory, particularly within and near the ACIS cavity. To this end, the current study employs a higher‐fidelity geometric model of the ACIS cavity, detailed thermal modeling based upon monitored temperature data, and an accordingly refined model of the molecular transport.
Document ID
20140002950
Acquisition Source
Marshall Space Flight Center
Document Type
Abstract
Authors
O'Dell, Stephen L.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Swartz, Douglas A.
(Universities Space Research Association Boulder, CO, United States)
Tice, Niel W.
(Lockheed Martin Space Systems Co. Denver, CO, United States)
Plucinsky, Paul P.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Grant, Catherine E.
(Massachusetts Inst. of Tech. Cambridge, MA, United States)
Marshall, Herman L.
(Massachusetts Inst. of Tech. Cambridge, MA, United States)
Vikhlinin, Alexey
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Tennant, Allyn F.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
April 15, 2014
Publication Date
August 25, 2013
Subject Category
Astrophysics
Report/Patent Number
M13-2464
Report Number: M13-2464
Meeting Information
Meeting: SPIE Optics and Photonics 2013
Location: San Diego, CA
Country: United States
Start Date: August 25, 2013
End Date: August 29, 2013
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Public Use Permitted.
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