NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
Single Event Testing on Complex Devices: Test Like You Fly versus Test-Specific Design StructuresWe present a framework for evaluating complex digital systems targeted for harsh radiation environments such as space. Focus is limited to analyzing the single event upset (SEU) susceptibility of designs implemented inside Field Programmable Gate Array (FPGA) devices. Tradeoffs are provided between application-specific versus test-specific test structures.
Document ID
20140005409
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Berg, Melanie (ASRC Federal Space and Defense Greenbelt, MD, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
May 9, 2014
Publication Date
March 31, 2014
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN28430
GSFC-E-DAA-TN13383
Report Number: GSFC-E-DAA-TN28430
Report Number: GSFC-E-DAA-TN13383
Meeting Information
Meeting: Government Microcircuit Applications and Critical Technologies (GOMACTech) Conference
Location: Charleston, SC
Country: United States
Start Date: March 31, 2014
End Date: April 3, 2014
Sponsors: Department of Defense
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Single Event Upset Testing
Error Rate Predictions
Field Programmable Gate Array (FPGA)

Related Records

There are no records associated with this record.
No Preview Available