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Humidity Testing of PME and BME Ceramic Capacitors with CracksCracks in ceramic capacitors are one of the major causes of failures during operation of electronic systems. Humidity testing has been successfully used for many years to verify the absence of cracks and assure quality of military grade capacitors. Traditionally, only precious metal electrode (PME) capacitors were used in high reliability applications and the existing requirements for humidity testing were developed for this type of parts. With the advance of base metal electrode (BME) capacitors, there is a need for assessment of the applicability of the existing techniques for the new technology capacitors. In this work, variety of different PME and BME capacitors with introduced cracks were tested in humid environments at different voltages and temperatures. Analysis of the test results indicates differences in the behavior and failure mechanisms for BME and PME capacitors and the need for different testing conditions.
Document ID
20140005412
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Teverovsky, Alexander A.
(QSS Group, Inc. Greenbelt, MD, United States)
Herzberger, Jaemi
(Maryland Univ. College Park, MD, United States)
Date Acquired
May 9, 2014
Publication Date
April 1, 2014
Subject Category
Quality Assurance And Reliability
Report/Patent Number
GSFC-E-DAA-TN30273
GSFC-E-DAA-TN13456
Report Number: GSFC-E-DAA-TN30273
Report Number: GSFC-E-DAA-TN13456
Meeting Information
Meeting: Capacitors and Resistors Technology Symposium (CARTS) 2014
Location: Santa Clara, CA
Country: United States
Start Date: April 1, 2014
End Date: April 3, 2014
Sponsors: NASA Goddard Space Flight Center
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
reliability
Base-Metal-Electrode (BME)
Precious Metal Electrode (PME)
humidity testing
multilayer ceramic capacitor (MLCC)
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