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Single Event Effects (SEE) Testing: Practical Approach to Test PlansWhile standards and guidelines for performing SEE testing have existed for several decades, guidance for developing SEE test plans has not been as easy to find. In this presentation, the variety of areas that need to be considered ranging from resource issues (funds, personnel, schedule) to extremely technical challenges (particle interaction and circuit application), shall be discussed. Note: we consider the approach outlined here as a "living" document: Mission-specific constraints and new technology related issues always need to be taken into account.
Document ID
20140005695
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Pellish, Jonathan Allen (NASA Goddard Space Flight Center Greenbelt, MD United States)
Berg, Melanie D. (AS and D, Inc. Greenbelt, MD)
Date Acquired
May 13, 2014
Publication Date
March 31, 2014
Subject Category
Spacecraft Design, Testing And Performance
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN13293
GSFC-E-DAA-TN26443
Report Number: GSFC-E-DAA-TN13293
Report Number: GSFC-E-DAA-TN26443
Meeting Information
Meeting: 2014 Government Microcircuits Applications and Critical Technologies Conference (GOMAC)
Location: Charleston, SC
Country: United States
Start Date: March 31, 2014
End Date: April 4, 2014
Sponsors: Department of Defense
Funding Number(s)
PROJECT: Proj. 2014-561-NEPP
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Single Event Effects (SEE)
Radiation Testing
NASA Electronic Parts and Packaging (NEPP)

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