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Genesis Solar Wind Collector Cleaning Assessment: 60366 Sample Case StudyIn order to recognize, localize, characterize and remove particle and thin film surface contamination, a small subset of Genesis mission collector fragments are being subjected to extensive study via various techniques [1-5]. Here we present preliminary results for sample 60336, a Czochralski silicon (Si-CZ) based wafer from the bulk array (B/C).
Document ID
20140006567
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
Goreva, Y. S.
(Smithsonian Institution Washington, DC, United States)
Gonzalez, C. P.
(Jacobs Technology, Inc. Houston, TX, United States)
Kuhlman, K. R.
(Planetary Science Inst. Tucson, AZ, United States)
Burnett, D. S.
(California Inst. of Tech. Pasadena, CA, United States)
Woolum, D.
(California State Univ. Fullerton, CA, United States)
Jurewicz, A. J.
(Arizona State Univ. Tempe, AZ, United States)
Allton, J. H.
(NASA Johnson Space Center Houston, TX, United States)
Rodriguez, M. C.
(GeoControls Systems, Inc. Houston, TX, United States)
Burkett, P. J.
(Jacobs Technology, Inc. Houston, TX, United States)
Date Acquired
June 3, 2014
Publication Date
March 17, 2014
Subject Category
Chemistry And Materials (General)
Report/Patent Number
JSC-CN-30369
Report Number: JSC-CN-30369
Meeting Information
Meeting: Lunar and Planetary Science Conference
Location: The Woodlands, TX
Country: United States
Start Date: March 17, 2014
End Date: March 21, 2014
Sponsors: NASA Headquarters, Lunar and Planetary Inst., Universities Space Research Association
Distribution Limits
Public
Copyright
Public Use Permitted.
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