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Single Event Analysis and Fault Injection Techniques Targeting Complex Designs Implemented in Xilinx-Virtex Family Field Programmable Gate Array (FPGA) DevicesAn informative session regarding SRAM FPGA basics. Presenting a framework for fault injection techniques applied to Xilinx Field Programmable Gate Arrays (FPGAs). Introduce an overlooked time component that illustrates fault injection is impractical for most real designs as a stand-alone characterization tool. Demonstrate procedures that benefit from fault injection error analysis.
Document ID
20140008976
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Berg, Melanie D.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
LaBel, Kenneth
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Kim, Hak
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Date Acquired
July 10, 2014
Publication Date
May 19, 2014
Subject Category
Space Radiation
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN36685
GSFC-E-DAA-TN14592
Report Number: GSFC-E-DAA-TN36685
Report Number: GSFC-E-DAA-TN14592
Meeting Information
Meeting: Single Event Effects (SEE) Symposium and the Military and Aerospace Programmable Logic Devices (MAPLD) Workshop
Location: La Jolla, CA
Country: United States
Start Date: May 19, 2014
End Date: May 22, 2014
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Single Event Upset Testing
Error Rate Predictions
Field Programmable Gate Array (FPGA)
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