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SEU System Analysis: Not Just the Sum of All PartsSingle event upset (SEU) analysis of complex systems is challenging. Currently, system SEU analysis is performed by component level partitioning and then either: the most dominant SEU cross-sections (SEUs) are used in system error rate calculations; or the partition SEUs are summed to eventually obtain a system error rate. In many cases, system error rates are overestimated because these methods generally overlook system level derating factors. The problem with overestimating is that it can cause overdesign and consequently negatively affect the following: cost, schedule, functionality, and validation/verification. The scope of this presentation is to discuss the risks involved with our current scheme of SEU analysis for complex systems; and to provide alternative methods for improvement.
Document ID
20140008977
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Berg, Melanie D.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Label, Kenneth
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
July 10, 2014
Publication Date
May 19, 2014
Subject Category
Electronics And Electrical Engineering
Space Radiation
Report/Patent Number
GSFC-E-DAA-TN36687
GSFC-E-DAA-TN14594
Report Number: GSFC-E-DAA-TN36687
Report Number: GSFC-E-DAA-TN14594
Meeting Information
Meeting: Single Event Effects (SEE) Symposium and the Military and Aerospace Programmable Logic Devices (MAPLD) Workshop
Location: La Jolla, CA
Country: United States
Start Date: May 19, 2014
End Date: May 22, 2014
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Single Event Upset (SEU) Testing
error rate calculations
Field Programmable Gate Array (FPGA)
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