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ALL-Digital Baseband 65nm PLL/FPLL Clock Multiplier Using 10-Cell LibraryPLLs for clock generation are essential for modern circuits, to generate specialized frequencies for many interfaces and high frequencies for chip internal operation. These circuits depend on analog circuits and careful tailoring for each new process, and making them fault tolerant is an incompletely solved problem. Until now, all digital PLLs have been restricted to sampled data DSP techniques and not available for the highest frequency baseband applications. This paper presents the design and preliminary evaluation of an all-digital baseband technique built entirely with an easily portable 10-cell digital library. The library is also described, as it aids in research and low volume design porting to new processes. The advantages of the digital approach are the wide variety of techniques available to give varying degrees of fault tolerance, and the simplicity of porting the design to new processes, even to exotic processes that may not have analog capability. The only tuning parameter is digital gate delay. An all-digital approach presents unique problems and standard analog loop stability design criteria cannot be directly used. Because of the quantization of frequency, there is effectively infinite gain for very small loop error feedback. The numerically controlled oscillator (NCO) based on a tapped delay line cannot be reliably updated while a pulse is active in the delay line, and ordinarily does not have enough frequency resolution for a low-jitter output.
Document ID
20140010568
Acquisition Source
Johnson Space Center
Document Type
Presentation
Authors
Schuler, Robert L., Jr.
(NASA Johnson Space Center Houston, TX, United States)
Wu, Qiong
(Saskatchewan Univ. Saskatoon, Saskatchewan, Canada)
Liu, Rui
(Saskatchewan Univ. Saskatoon, Saskatchewan, Canada)
Chen, Li
(Saskatchewan Univ. Saskatoon, Saskatchewan, Canada)
Madala, Shridhar
(Indus Instruments Houston, TX, United States)
Date Acquired
August 12, 2014
Publication Date
May 19, 2014
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
JSC-CN-31238
Report Number: JSC-CN-31238
Meeting Information
Meeting: Single Event Effects (SEE) Symposium 2014
Location: San Diego, CA
Country: United States
Start Date: May 19, 2014
End Date: May 22, 2014
Sponsors: Sandia National Labs., Naval Research Lab., Lockheed Martin Corp., Vanderbilt Univ., Aerospace Corp., The Aeroflex Corp, Brigham Young Univ.
Funding Number(s)
WBS: WBS 170786.07.80.13.05
Distribution Limits
Public
Copyright
Public Use Permitted.
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