NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Advisory – Planned Maintenance: On Monday, July 15 at 9 PM Eastern the STI Compliance and Distribution Services will be performing planned maintenance on the STI Repository (NTRS) for approximately one hour. During this time users will not be able to access the STI Repository (NTRS).

Back to Results
NEPP DDR Device Reliability FY13 ReportThis document reports the status of the NEPP Double Data Rate (DDR) Device Reliability effort for FY2013. The task targeted general reliability of > 100 DDR2 devices from Hynix, Samsung, and Micron. Detailed characterization of some devices when stressed by several data storage patterns was studied, targeting ability of the data cells to store the different data patterns without refresh, highlighting the weakest bits. DDR2, Reliability, Data Retention, Temperature Stress, Test System Evaluation, General Reliability, IDD measurements, electronic parts, parts testing, microcircuits
Document ID
20140011390
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/44642
Authors
Guertin, Steven M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Armbar, Mehran (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
September 8, 2014
Publication Date
January 1, 2014
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
JPL-Publ-13-13
Funding Number(s)
WBS: WBS 724297.40.49.11
CONTRACT_GRANT: NAS7-03001
TASK: Task No. 102024
PROJECT: JPL Proj. No. 104309
Distribution Limits
Public
Copyright
Public Use Permitted.

Related Records

There are no records associated with this record.
No Preview Available