NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Laboratory Instruments Available to Support Space Station Researchers at Marshall Space Flight CenterA number of research instruments are available at NASA's Marshall Space Flight Center (MSFC) to support ISS researchers and their investigations. These modern analytical tools yield valuable and sometimes new informative resulting from sample characterization. Instruments include modern scanning electron microscopes equipped with field emission guns providing analytical capabilities that include angstron-level image resolution of dry, wet and biological samples. These microscopes are also equipped with silicon drift X-ray detectors (SDD) for fast yet precise analytical mapping of phases, as well as electron back-scattered diffraction (EBSD) units to map grain orientations in crystalline alloys. Sample chambers admit large samples, provide variable pressures for wet samples, and quantitative analysis software to determine phase relations. Advances in solid-state electronics have also facilitated improvements for surface chemical analysis that are successfully employed to analyze metallic materials and alloys, ceramics, slags, and organic polymers. Another analytical capability at MSFC is a mganetic sector Secondary Ion Mass Spectroscopy (SIMS) that quantitatively determines and maps light elements such as hydrogen, lithium, and boron along with their isotopes, identifies and quantifies very low level impurities even at parts per billion (ppb) levels. Still other methods available at MSFC include X-ray photo-electron spectroscopy (XPS) that can determine oxidation states of elements as well as identify polymers and measure film thicknesses on coated materials, Scanning Auger electron spectroscopy (SAM) which combines surface sensitivity, spatial lateral resolution (approximately 20 nm), and depth profiling capabilities to describe elemental compositions in near surface regions and even the chemical state of analyzed atoms. Conventional Transmission Electron Microscope (TEM) for observing internal microstructures at very high magnifications and the Electron Probe Micro-analyzer (EPMA) for very precise microanalysis are available as needed by the researcher. Space Station researchers are invited to work with MSFC in analyzing their samples using these techniques.
Document ID
20140011640
Acquisition Source
Marshall Space Flight Center
Document Type
Presentation
Authors
Panda, Binayak
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Gorti, Sridhar
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 12, 2014
Publication Date
November 3, 2013
Subject Category
Spacecraft Instrumentation And Astrionics
Report/Patent Number
M13-3056
Meeting Information
Meeting: American Society for Gravitational and Space Research (ASGSR)
Location: Orlando, FL
Country: United States
Start Date: November 3, 2013
End Date: November 8, 2013
Sponsors: American Society for Gravitational and Space Research
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available