Performance of an Achromatic Focal Plane Mask for Exoplanet Imaging CoronagraphyCoronagraph technology combined with wavefront control is close to achieving the contrast and inner working angle requirements in the lab necessary to observe the faint signal of an Earth-like exoplanet in monochromatic light. An important remaining technological challenge is to achieve high contrast in broadband light. Coronagraph bandwidth is largely limited by chromaticity of the focal plane mask, which is responsible for blocking the stellar PSF. The size of a stellar PSF scales linearly with wavelength; ideally, the size of the focal plane mask would also scale with wavelength. A conventional hard-edge focal plane mask has a fixed size, normally sized for the longest wavelength in the observational band to avoid starlight leakage. The conventional mask is oversized for shorter wavelengths and blocks useful discovery space. Recently we presented a solution to the size chromaticity challenge with a focal plane mask designed to scale its effective size with wavelength. In this paper, we analyze performance of the achromatic size-scaling focal plane mask within a Phase Induced Amplitude Apodization (PIAA) coronagraph. We present results from wavefront control around the achromatic focal plane mask, and demonstrate the size-scaling effect of the mask with wavelength. The edge of the dark zone, and therefore the inner working angle of the coronagraph, scale with wavelength. The achromatic mask enables operation in a wider band of wavelengths compared with a conventional hard-edge occulter.
Document ID
20140011824
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Newman, Kevin (Arizona Univ. Tucson, AZ, United States)
Belikov, Ruslan (NASA Ames Research Center Moffett Field, CA United States)
Pluzhnik, Eugene (NASA Ames Research Center Moffett Field, CA United States)
Balasubramanian, Kunjithapatham (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Wilson, Dan (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
September 17, 2014
Publication Date
June 22, 2014
Subject Category
Instrumentation And PhotographyAstronomy
Report/Patent Number
ARC-E-DAA-TN15899Report Number: ARC-E-DAA-TN15899
Meeting Information
Meeting: SPIE Astronomical Telescopes and Instrumentation Conference
Location: Montreal, Quebec
Country: Canada
Start Date: June 22, 2014
End Date: June 27, 2014
Sponsors: International Society for Optical Engineering