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Development of New Dielectric NDE Techniques for Spaceflight MaterialsDielectric Spectroscopy is a relatively new technique for non-destructively measuring material properties. The goal for this project is to extend the use of state-of-the-art dielectric spectroscopy systems to measure the spectra of spaceflight materials and develop non-destructive evaluation (NDE) sensors based on dielectric material properties. This work may lead to a new class of material density, moisture, temperature, and defect sensors providing structural integrity and health measurements for future spacecraft and launch structures.
Document ID
20140011872
Acquisition Source
Kennedy Space Center
Document Type
Presentation
Authors
Nurge, Mark A.
(NASA Kennedy Space Center Cocoa Beach, FL United States)
Date Acquired
September 17, 2014
Publication Date
June 13, 2014
Subject Category
Solid-State Physics
Report/Patent Number
KSC-E-DAA-TN15846
Report Number: KSC-E-DAA-TN15846
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
Project
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