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Uncertainty Analysis of Seebeck Coefficient and Electrical Resistivity CharacterizationIn order to provide a complete description of a materials thermoelectric power factor, in addition to the measured nominal value, an uncertainty interval is required. The uncertainty may contain sources of measurement error including systematic bias error and precision error of a statistical nature. The work focuses specifically on the popular ZEM-3 (Ulvac Technologies) measurement system, but the methods apply to any measurement system. The analysis accounts for sources of systematic error including sample preparation tolerance, measurement probe placement, thermocouple cold-finger effect, and measurement parameters; in addition to including uncertainty of a statistical nature. Complete uncertainty analysis of a measurement system allows for more reliable comparison of measurement data between laboratories.
Document ID
20140012564
Acquisition Source
Glenn Research Center
Document Type
Presentation
Authors
Mackey, Jon
(Case Western Reserve Univ. Cleveland, OH, United States)
Sehirlioglu, Alp
(Case Western Reserve Univ. Cleveland, OH, United States)
Dynys, Fred
(NASA Glenn Research Center Cleveland, OH, United States)
Date Acquired
September 24, 2014
Publication Date
January 22, 2014
Subject Category
Solid-State Physics
Electronics And Electrical Engineering
Report/Patent Number
GRC-E-DAA-TN12884
Report Number: GRC-E-DAA-TN12884
Meeting Information
Meeting: Electronic Materials and Applications
Location: Orlando, Florida
Country: United States
Start Date: January 22, 2014
End Date: January 24, 2014
Sponsors: American Ceramic Society
Funding Number(s)
WBS: WBS 138494.04.02.01
CONTRACT_GRANT: NNC13BA10B
CONTRACT_GRANT: NNX08AB43A
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Seebeck effect
electrical resistivity
thermoelectric materials
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