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Destructive Single-Event Failures in Schottky DiodesThis presentation contains test results for destructive failures in DC-DC converters. We have shown that Schottky diodes are susceptible to destructive single-event effects. Future work will be completed to identify parameter that determines diode susceptibility.
Document ID
20140017071
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Casey, Megan C.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Lauenstein, Jean-Marie
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Gigliuto, Robert A.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Wilcox, Edward P.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Phan, Anthony M.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Kim, Hak
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Chen, Dakai
(NASA Goddard Space Flight Center Greenbelt, MD United States)
LaBel, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
December 8, 2014
Publication Date
June 17, 2014
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN16278
GSFC-E-DAA-TN15271
Report Number: GSFC-E-DAA-TN16278
Report Number: GSFC-E-DAA-TN15271
Meeting Information
Meeting: NASA Electronic Parts and Packaging (NEPP) Electronics Technology Workshop
Location: Greenbelt, MD
Country: United States
Start Date: June 17, 2014
End Date: June 19, 2014
Sponsors: NASA Goddard Space Flight Center
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Schottky Diodes
DC-DC converters
destructive single-event effects
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