Acquisition Source
Goddard Space Flight Center
Document Type
Reprint (Version printed in journal)
Authors
Hokin, M.S. (Wisconsin Univ. Madison, WI, United States) McCammon, D. (Wisconsin Univ. Madison, WI, United States) Morgan, K.M. (Wisconsin Univ. Madison, WI, United States) Bandler, Simon Richard (Maryland Univ. College Park, MD, United States) Lee, S.J. (Oak Ridge Associated Universities Greenbelt, MD, United States) Moseley, S.H. (NASA Goddard Space Flight Center Greenbelt, MD United States) Smith, S.J. (Maryland Univ. Baltimore County Baltimore, MD, United States) Date Acquired
January 6, 2015
Publication Date
December 24, 2013
Publication Information
Publisher: Springer Science+Business Media New York
Subject Category
Electronics And Electrical Engineering Report/Patent Number
GSFC-E-DAA-TN15564Report Number: GSFC-E-DAA-TN15564 Funding Number(s)
CONTRACT_GRANT: NNG06EO90A
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
high resolution detectorsx-ray microcalorimeterscalibration source