NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Methods and Systems for Characterization of an Anomaly Using Infrared Flash ThermographyA method for characterizing an anomaly in a material comprises (a) extracting contrast data; (b) measuring a contrast evolution; (c) filtering the contrast evolution; (d) measuring a peak amplitude of the contrast evolution; (d) determining a diameter and a depth of the anomaly, and (e) repeating the step of determining the diameter and the depth of the anomaly until a change in the estimate of the depth is less than a set value. The step of determining the diameter and the depth of the anomaly comprises estimating the depth using a diameter constant C.sub.D equal to one for the first iteration of determining the diameter and the depth; estimating the diameter; and comparing the estimate of the depth of the anomaly after each iteration of estimating to the prior estimate of the depth to calculate the change in the estimate of the depth of the anomaly.
Document ID
20150003144
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Koshti, Ajay M.
Date Acquired
March 18, 2015
Publication Date
November 5, 2013
Subject Category
Computer Programming And Software
Report/Patent Number
Patent Application Number: US-Patent-Appl-SN-12/900,644
Patent Number: US-Patent-8,577,120
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-8,577,120
Patent Application
US-Patent-Appl-SN-12/900,644
No Preview Available