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Parametric Trace SlicingA program trace is obtained and events of the program trace are traversed. For each event identified in traversing the program trace, a trace slice of which the identified event is a part is identified based on the parameter instance of the identified event. For each trace slice of which the identified event is a part, the identified event is added to an end of a record of the trace slice. These parametric trace slices can be used in a variety of different manners, such as for monitoring, mining, and predicting.
Document ID
20150003291
Acquisition Source
Langley Research Center
Document Type
Other - Patent
Authors
Rosu, Grigore
Chen, Feng
Chen, Guo-fang
Wu, Yamei
Meredith, Patrick O.
Date Acquired
March 19, 2015
Publication Date
May 6, 2014
Subject Category
Computer Programming And Software
Report/Patent Number
Patent Number: US-Patent-8,719,796
Patent Application Number: US-Patent-Appl-SN-13/012,133
Funding Number(s)
CONTRACT_GRANT: NSF CCF-0448501
CONTRACT_GRANT: NSF CNS-0509321
CONTRACT_GRANT: NSF CNS-0720512
CONTRACT_GRANT: NNL08AA23C
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-8,719,796
Patent Application
US-Patent-Appl-SN-13/012,133
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