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Copper Nanowire Production for Interconnect ApplicationsA method of fabricating metallic Cu nanowires with lengths up to about 25 micrometers and diameters in a range 20-100 nanometers, or greater if desired. Vertically oriented or laterally oriented copper oxide structures (CuO and/or Cu2O) are grown on a Cu substrate. The copper oxide structures are reduced with 99+ percent H or H2, and in this reduction process the lengths decrease (to no more than about 25 micrometers), the density of surviving nanostructures on a substrate decreases, and the diameters of the surviving nanostructures have a range, of about 20-100 nanometers. The resulting nanowires are substantially pure Cu and can be oriented laterally (for local or global interconnects) or can be oriented vertically (for standard vertical interconnects).
Document ID
20150003415
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Han, Jin-Woo
Meyyappan, Meyya
Date Acquired
March 20, 2015
Publication Date
September 16, 2014
Subject Category
Metals And Metallic Materials
Electronics And Electrical Engineering
Mechanical Engineering
Report/Patent Number
Patent Number: US-Patent-8,834,597
Patent Application Number: US-Patent-Appl-SN-13/485,721
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-8,834,597
Patent Application
US-Patent-Appl-SN-13/485,721
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