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Interferometric Quasi-AutocollimatorSystems and method are disclosed for measuring small angular deflections of a target using weak value amplification. A system includes a beam source, a beam splitter, a target reflecting surface, a photodetector, and a processor. The beam source generates an input beam that is split into first and second beams by the beam splitter. The first and second beams are propagated to the target reflecting surface, at least partially superimposed at the target reflecting surface, and incident to the target reflecting surface normal to the target reflecting surface. The first beam is reflected an additional even number of times during propagation to the photodetector. The second beam is reflected an additional odd number of times during propagation to the photodetector. The first and second beams interfere at the photodetector so as to produce interference patterns. The interference patterns are interpreted to measure angular deflections of the target reflecting surface.
Document ID
20150003422
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Turner, Matthew D.
Gundlach, Jens H.
Hagedorn, Charles A.
Schlamminger, Stephan
Date Acquired
March 20, 2015
Publication Date
September 23, 2014
Subject Category
Optics
Report/Patent Number
Patent Number: US-Patent-8,842,291
Patent Application Number: US-Patent-Appl-SN-13/426,309
Funding Number(s)
CONTRACT_GRANT: PHY0969199
CONTRACT_GRANT: PHY0653863
CONTRACT_GRANT: NNX08AY66G
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-8,842,291
Patent Application
US-Patent-Appl-SN-13/426,309
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