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BME Capacitor Risk ManagmentNo abstract available
Document ID
20150005514
Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
External Source(s)
hdl:2014/43186
Authors
Sheldon, Douglas J. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
April 10, 2015
Publication Date
December 11, 2012
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Microelectronics Reliability and Qualification Workshop
Location: Los Angeles, CA
Country: United States
Start Date: December 11, 2012
End Date: December 12, 2012
Sponsors: Aerospace Corp.
Distribution Limits
Public
Copyright
Other
Keywords
precious metal electrods (PME)
Field-Programmable Gate Array (FPGA)
base metal electrode (BME)

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