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Recent Power MOSFET Test ResultsThe results of recent Single Event Effect (SEE) testing of newly available power MOSFETS are presented.
Document ID
20150006922
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/43881
Authors
Scheick, Leif Z. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Gauthier, Michael (SEMICOA Corp. Costa Mesa, CA, United States)
Gauthier, Brian (SEMICOA Corp. Costa Mesa, CA, United States)
Triggs, Brian (SEMICOA Corp. Costa Mesa, CA, United States)
Date Acquired
April 29, 2015
Publication Date
July 25, 2011
Subject Category
Solid-State Physics
Meeting Information
Meeting: 2011 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2011)
Location: Las Vegas, NV
Country: United States
Start Date: July 25, 2011
End Date: July 29, 2011
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
radiation hard power solutions
Single Event Burnout (SEB).
Single Event Gate Rupture (SEGR)

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