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Analysis of Accelerated Life Test for BME CapacitorsNo abstract available
Document ID
20150008208
Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
External Source(s)
hdl:2014/44547
Authors
Sheldon, Douglas (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
May 15, 2015
Publication Date
December 10, 2013
Subject Category
Quality Assurance And Reliability
Meeting Information
Meeting: Microelectronics Reliability and Qualification Working Meeting
Location: El Segundo, CA
Country: United States
Start Date: December 10, 2013
End Date: December 11, 2013
Sponsors: Aerospace Corp.
Distribution Limits
Public
Copyright
Other
Keywords
HALT
Weibull

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