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SOC SEE Test Guideline DevelopmentNo abstract available
Document ID
20150008314
Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
External Source(s)
hdl:2014/44607
Authors
Guertin, Steven M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
May 18, 2015
Publication Date
April 9, 2013
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: SEE Symposium Military and Aerospace Programmable Logic Devices
Location: San Diego, CA
Country: United States
Start Date: April 9, 2013
End Date: April 12, 2013
Sponsors: Aeroflex Lintek Corp., Department of the Navy
Distribution Limits
Public
Copyright
Other
Keywords
single event effects (SEE)
test methods
Maestro
freescale
effective sensitivity
system on a chip

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