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Principal Component Analysis of Thermographic DataPrincipal Component Analysis (PCA) has been shown effective for reducing thermographic NDE data. While a reliable technique for enhancing the visibility of defects in thermal data, PCA can be computationally intense and time consuming when applied to the large data sets typical in thermography. Additionally, PCA can experience problems when very large defects are present (defects that dominate the field-of-view), since the calculation of the eigenvectors is now governed by the presence of the defect, not the "good" material. To increase the processing speed and to minimize the negative effects of large defects, an alternative method of PCA is being pursued where a fixed set of eigenvectors, generated from an analytic model of the thermal response of the material under examination, is used to process the thermal data from composite materials. This method has been applied for characterization of flaws.
Document ID
20150010974
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Winfree, William P.
(NASA Langley Research Center Hampton, VA, United States)
Cramer, K. Elliott
(NASA Langley Research Center Hampton, VA, United States)
Zalameda, Joseph N.
(NASA Langley Research Center Hampton, VA, United States)
Howell, Patricia A.
(NASA Langley Research Center Hampton, VA, United States)
Burke, Eric R.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
June 17, 2015
Publication Date
April 20, 2015
Subject Category
Statistics And Probability
Report/Patent Number
NF1676L-19858
Report Number: NF1676L-19858
Meeting Information
Meeting: SPIE DSS 2015 - Defense, Security and Sensing: Sensing Technology + Applications
Location: Baltimore, MD
Country: United States
Start Date: April 20, 2015
End Date: April 24, 2015
Sponsors: International Society for Optical Engineering
Funding Number(s)
WBS: WBS 432938.08.01.07.43
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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