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Linear Fresnel Spectrometer Chip with Gradient Line GratingA spectrometer that includes a grating that disperses light via Fresnel diffraction according to wavelength onto a sensing area that coincides with an optical axis plane of the grating. The sensing area detects the dispersed light and measures the light intensity associated with each wavelength of the light. Because the spectrometer utilizes Fresnel diffraction, it can be miniaturized and packaged as an integrated circuit.
Document ID
20150012192
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Choi, Sang Hyouk
Park, Yeonjoon
Date Acquired
July 1, 2015
Publication Date
June 2, 2015
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Application Number: US-Patent-Appl-SN-13/775,809
Patent Number: US-Patent-9,046,418
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-9,046,418
Patent Application
US-Patent-Appl-SN-13/775,809
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