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Cleaning and Cleanliness Measurement of Additive Manufactured PartsThe successful acquisition and utilization of piece parts and assemblies for contamination sensitive applications requires application of cleanliness acceptance criteria. Contamination can be classified using many different schemes. One common scheme is classification as organic, ionic and particulate contaminants. These may be present in and on the surface of solid components and assemblies or may be dispersed in various gaseous or liquid media. This discussion will focus on insoluble particle contamination on the surface of piece parts and assemblies. Cleanliness of parts can be controlled using two strategies, referred to as gross cleanliness and precision cleanliness. Under a gross cleanliness strategy acceptance is based on visual cleanliness. This approach introduces a number of concerns that render it unsuitable for controlling cleanliness of high technology products. Under the precision cleanliness strategy, subjective, visual assessment of cleanliness is replaced by objective measurement of cleanliness. When a precision cleanliness strategy is adopted there naturally arises the question: How clean is clean enough? The six commonly used methods for establishing objective cleanliness acceptance limits will be discussed. Special emphasis shall focus on the use of multiple extraction, a technique that has been demonstrated for additively manufactured parts.
Document ID
20150016268
Acquisition Source
Marshall Space Flight Center
Document Type
Abstract
Authors
Welker, Roger W.
(Jacobs Engineering Group, Inc. Huntsville, AL, United States)
Mitchell, Mark A.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 21, 2015
Publication Date
June 1, 2015
Subject Category
Space Processing
Report/Patent Number
M15-4387
Report Number: M15-4387
Meeting Information
Meeting: Commercial and Government Responsive Access to Space Technology Exchange
Location: Chantilly, VA
Country: United States
Start Date: June 22, 2015
End Date: June 25, 2015
Sponsors: NASA Headquarters, Federal Aviation Administration, Department of Energy, Department of Defense
Distribution Limits
Public
Copyright
Public Use Permitted.
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