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Measuring Skew in Average Surface Roughness as a Function of Surface PreparationNo abstract available
Document ID
20150019520
Acquisition Source
Marshall Space Flight Center
Document Type
Presentation
Authors
Stahl, Mark
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
October 20, 2015
Publication Date
April 21, 2015
Subject Category
Optics
Report/Patent Number
M15-4822
Report Number: M15-4822
Meeting Information
Meeting: International Society for Optics and Phononics (SPIE)
Location: San Diego, CA
Country: United States
Start Date: August 9, 2015
End Date: August 13, 2015
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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