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System and Method for Null-Lens Wavefront SensingA method of measuring aberrations in a null-lens including assembly and alignment aberrations. The null-lens may be used for measuring aberrations in an aspheric optic with the null-lens. Light propagates from the aspheric optic location through the null-lens, while sweeping a detector through the null-lens focal plane. Image data being is collected at locations about said focal plane. Light is simulated propagating to the collection locations for each collected image. Null-lens aberrations may extracted, e.g., applying image-based wavefront-sensing to collected images and simulation results. The null-lens aberrations improve accuracy in measuring aspheric optic aberrations.
Document ID
20160000165
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Hill, Peter C.
Thompson, Patrick L.
Aronstein, David L.
Bolcar, Matthew R.
Smith, Jeffrey S.
Date Acquired
January 4, 2016
Publication Date
December 8, 2015
Subject Category
Optics
Report/Patent Number
Patent Application Number: US-Patent-Appl-SN-14/186,833
Patent Number: US-Patent-9,207,145
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-9,207,145
Patent Application
US-Patent-Appl-SN-14/186,833
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