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Controlling Charged Particles with Inhomogeneous Electrostatic FieldsAn energy analyzer for a charged-particle spectrometer may include a top deflection plate and a bottom deflection plate. The top and bottom deflection plates may be non-symmetric and configured to generate an inhomogeneous electrostatic field when a voltage is applied to one of the top or bottom deflection plates. In some instances, the top and bottom deflection plates may be L-shaped deflection plates.
Document ID
20160001306
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Herrero, Federico A.
Date Acquired
February 1, 2016
Publication Date
January 26, 2016
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: US-Patent-9,245,726
Patent Application Number: US-Patent-Appl-SN-14/497,247
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-9,245,726
Patent Application
US-Patent-Appl-SN-14/497,247
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