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A Miniaturized Variable Pressure Scanning Electron Microscope (MVP-SEM) for In-Situ Mars Surface Sample AnalysisThe Miniaturized Variable Pressure Scanning Electron Microscope (MVP-SEM) project, funded by the NASA Planetary Instrument Concepts for the Advancement of Solar System Observations (PICASSO) Research Opportunities in Space and Earth Sciences (ROSES), will build upon previous miniaturized SEM designs and recent advancements in variable pressure SEM's to design and build a SEM to complete analyses of samples on the surface of Mars using the atmosphere as an imaging medium. This project is a collaboration between NASA Marshall Space Flight Center (MSFC), the Jet Propulsion Laboratory (JPL), electron gun and optics manufacturer Applied Physics Technologies, and small vacuum system manufacturer Creare. Dr. Ralph Harvery and environmental SEM (ESEM) inventor Dr. Gerry Danilatos serve as advisors to the team. Variable pressure SEMs allow for fine (nm-scale) resolution imaging and micron-scale chemical study of materials without sample preparation (e.g., carbon or gold coating). Charging of a sample is reduced or eliminated by the gas surrounding the sample. It is this property of ESEMs that make them ideal for locations where sample preparation is not yet feasible, such as the surface of Mars. In addition, the lack of sample preparation needed here will simplify the sample acquisition process and allow caching of the samples for future complementary payload use.
Document ID
20160003705
Acquisition Source
Marshall Space Flight Center
Document Type
Conference Paper
Authors
Edmunson, J.
(Jacobs Engineering and Science Services and Skills Augmentation Group (ESSSA) Huntsville, AL, United States)
Gaskin, J. A.
(NASA Marshall Space Flight Center Huntsville, AL United States)
Jerman, G. A.
(NASA Marshall Space Flight Center Huntsville, AL United States)
Harvey, R. P.
(Case Western Reserve Univ. Cleveland, OH, United States)
Doloboff, I. J.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Neidholdt, E. L.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
March 23, 2016
Publication Date
March 21, 2016
Subject Category
Instrumentation And Photography
Lunar And Planetary Science And Exploration
Report/Patent Number
MSFC-E-DAA-TN30461
Meeting Information
Meeting: Lunar and Planetary Science Conference
Location: The Woodlands, TX
Country: United States
Start Date: March 21, 2016
End Date: March 25, 2016
Sponsors: Lunar and Planetary Inst., Universities Space Research Association
Funding Number(s)
CONTRACT_GRANT: NNM12AA41C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Microscope
In-situ
Mars
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