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Theoretical Accuracy for ESTL Bit Error Rate Tests"Bit error rate" [BER] for the purposes of this paper is the fraction of binary bits which are inverted by passage through a communication system. BER can be measured for a block of sample bits by comparing a received block with the transmitted block and counting the erroneous bits. Bit Error Rate [BER] tests are the most common type of test used by the ESTL for evaluating system-level performance. The resolution of the test is obvious: the measurement cannot be resolved more finely than 1/N, the number of bits tested. The tolerance is not. This paper examines the measurement accuracy of the bit error rate test. It is intended that this information will be useful in analyzing data taken in the ESTL. This paper is divided into four sections and follows a logically ordered presentation, with results developed before they are evaluated. However, first-time readers will derive the greatest benefit from this paper by skipping the lengthy section devoted to analysis, and treating it as reference material. The analysis performed in this paper is based on a Probability Density Function [PDF] which is developed with greater detail in a past paper, Theoretical Accuracy for ESTL Probability of Acquisition Tests, EV4-98-609.
Document ID
20160005085
Acquisition Source
Johnson Space Center
Document Type
Other
Authors
Lansdowne, Chatwin
(NASA Johnson Space Center Houston, TX, United States)
Date Acquired
April 14, 2016
Publication Date
September 1, 1998
Subject Category
Ground Support Systems And Facilities (Space)
Computer Programming And Software
Report/Patent Number
JSC-CN-35020
EV4-98-610
EVA4-10/98-0xx
Report Number: JSC-CN-35020
Report Number: EV4-98-610
Report Number: EVA4-10/98-0xx
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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