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Deducing Electronic Unit Internal Response During a Vibration Test Using a Lumped Parameter Modeling ApproachNo abstract available
Document ID
20160005636
Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
External Source(s)
hdl:2014/45505
Authors
Van Dyke, Michael B. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
May 2, 2016
Publication Date
March 25, 2014
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Aerospace Testing Seminar
Location: Los Angeles, CA
Country: United States
Start Date: March 25, 2014
End Date: March 27, 2014
Sponsors: NASA Headquarters
Distribution Limits
Public
Copyright
Other

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