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Subharmonic Oscillations and Chaos in Dynamic Atomic Force MicroscopyThe increasing use of dynamic atomic force microscopy (d-AFM) for nanoscale materials characterization calls for a deeper understanding of the cantilever dynamics influencing scan stability, predictability, and image quality. Model development is critical to such understanding. Renormalization of the equations governing d- AFM provides a simple interpretation of cantilever dynamics as a single spring and mass system with frequency dependent cantilever stiffness and damping parameters. The renormalized model is sufficiently robust to predict the experimentally observed splitting of the free-space cantilever resonance into multiple resonances upon cantilever-sample contact. Central to the model is the representation of the cantilever sample interaction force as a polynomial expansion with coefficients F(sub ij) (i,j = 0, 1, 2) that account for the effective interaction stiffness parameter, the cantilever-to-sample energy transfer, and the amplitude of cantilever oscillation. Application of the Melnikov method to the model equation is shown to predict a homoclinic bifurcation of the Smale horseshoe type leading to a cascade of period doublings with increasing drive displacement amplitude culminating in chaos and loss of image quality. The threshold value of the drive displacement amplitude necessary to initiate subharmonic generation depends on the acoustic drive frequency, the effective damping coefficient, and the nonlinearity of the cantilever-sample interaction force. For parameter values leading to displacement amplitudes below threshold for homoclinic bifurcation other bifurcation scenarios can occur, some of which lead to chaos.
Document ID
20160006091
Acquisition Source
Langley Research Center
Document Type
Presentation
Authors
Cantrell, John H.
(NASA Langley Research Center Hampton, VA, United States)
Cantrell, Sean A.
(NLS Analytics, LLC Glencoe, Illinois, United States)
Date Acquired
May 13, 2016
Publication Date
June 22, 2015
Subject Category
Numerical Analysis
Report/Patent Number
NF1676L-20440
Report Number: NF1676L-20440
Meeting Information
Meeting: International Symposium on Nondestructive Characterization of Materials
Location: Los Angeles, CA
Country: United States
Start Date: June 22, 2015
End Date: June 26, 2015
Sponsors: MAST, Inc.
Funding Number(s)
WBS: WBS 228536.04.07.07
Distribution Limits
Public
Copyright
Public Use Permitted.
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