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System and Method for Outlier Detection via Estimating ClustersAn efficient method and system for real-time or offline analysis of multivariate sensor data for use in anomaly detection, fault detection, and system health monitoring is provided. Models automatically derived from training data, typically nominal system data acquired from sensors in normally operating conditions or from detailed simulations, are used to identify unusual, out of family data samples (outliers) that indicate possible system failure or degradation. Outliers are determined through analyzing a degree of deviation of current system behavior from the models formed from the nominal system data. The deviation of current system behavior is presented as an easy to interpret numerical score along with a measure of the relative contribution of each system parameter to any off-nominal deviation. The techniques described herein may also be used to "clean" the training data.
Document ID
20160007310
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Iverson, David J.
Date Acquired
June 8, 2016
Publication Date
May 10, 2016
Subject Category
Systems Analysis And Operations Research
Report/Patent Number
Patent Number: US-Patent-9,336,484
Patent Application Number: US-Patent-Appl-SN-13/615,202
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-9,336,484
Patent Application
US-Patent-Appl-SN-13/615,202
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