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Improved Test Planning and Analysis Through the Use of Advanced Statistical MethodsThe goal of this work is, through computational simulations, to provide statistically-based evidence to convince the testing community that a distributed testing approach is superior to a clustered testing approach for most situations. For clustered testing, numerous, repeated test points are acquired at a limited number of test conditions. For distributed testing, only one or a few test points are requested at many different conditions. The statistical techniques of Analysis of Variance (ANOVA), Design of Experiments (DOE) and Response Surface Methods (RSM) are applied to enable distributed test planning, data analysis and test augmentation. The D-Optimal class of DOE is used to plan an optimally efficient single- and multi-factor test. The resulting simulated test data are analyzed via ANOVA and a parametric model is constructed using RSM. Finally, ANOVA can be used to plan a second round of testing to augment the existing data set with new data points. The use of these techniques is demonstrated through several illustrative examples. To date, many thousands of comparisons have been performed and the results strongly support the conclusion that the distributed testing approach outperforms the clustered testing approach.
Document ID
20160007675
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Green, Lawrence L.
(NASA Langley Research Center Hampton, VA, United States)
Maxwell, Katherine A.
(Minnesota Univ. Minneapolis, MN, United States)
Glass, David E.
(NASA Langley Research Center Hampton, VA, United States)
Vaughn, Wallace L.
(NASA Langley Research Center Hampton, VA, United States)
Barger, Weston
(Washington Univ. Seattle, WA, United States)
Cook, Mylan
(Brigham Young Univ. Provo, UT, United States)
Date Acquired
June 17, 2016
Publication Date
January 4, 2016
Subject Category
Numerical Analysis
Report/Patent Number
NF1676L-21573
Report Number: NF1676L-21573
Meeting Information
Meeting: AIAA SciTech Conference 2016
Location: San Diego, CA
Country: United States
Start Date: January 4, 2016
End Date: January 8, 2016
Sponsors: American Inst. of Aeronautics and Astronautics
Funding Number(s)
WBS: WBS 109492.02.07.01.11.03
Distribution Limits
Public
Copyright
Public Use Permitted.
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