Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Casey, Megan C. (NASA Goddard Space Flight Center Greenbelt, MD United States) Campola, Michael J. (NASA Goddard Space Flight Center Greenbelt, MD United States) Lauenstein, Jean-Marie (NASA Goddard Space Flight Center Greenbelt, MD United States) Wilcox, Edward P. (ASRC Federal Space and Defense Greenbelt, MD, United States) Phan, Anthony M. (ASRC Federal Space and Defense Greenbelt, MD, United States) LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States) Date Acquired
June 20, 2016
Publication Date
June 13, 2016
Subject Category
Quality Assurance And ReliabilityElectronics And Electrical Engineering Report/Patent Number
GSFC-E-DAA-TN32636GSFC-E-DAA-TN33316GSFC-E-DAA-TN33016Report Number: GSFC-E-DAA-TN32636Report Number: GSFC-E-DAA-TN33316Report Number: GSFC-E-DAA-TN33016 Meeting Information
Meeting: 2016 NEPP Electronics Technology Workshop (ETW)
Location: Greenbelt, MD
Country: United States
Start Date: June 13, 2016
End Date: June 16, 2016
Sponsors: NASA Headquarters
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
single event effects (SEE)Schottky diodeheavy ionhardness assurance 